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Chinese National Standards
中華民國國家標準
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Taiwan
台灣 -
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CNS 4124:1998
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Ty
p
e A3 standard test block for ultrasonic angle beam testing
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B-¾÷±ñ¤uµ{
CNS 9964:1998
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Âi¦¡ÆF±ÓÆp§Éºë«×ÀËÅç
Test code for accuracy of drilling machines,sensitive,bench ty
p
e
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C-¹q¾÷¤uµ{, ¹q¤l¤uµ{
CNS 4856:1998
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¹q¤l³]³Æ¥Î¾T½è¹q¸Ñ¹q®e¾¹¡]©TÅé¤Î«D©TÅé¹q¸Ñ½è¡^
Fixed ca
p
acitors for use in electronic equi
p
ment (Aluminium electrolytic ca
p
acitors with solid and non-solid electrolyte)
- English Version
T-½Ã¥Í¤ÎÂåÀø¾¹§÷
CNS 7452:1998
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Dental ex
p
lorers
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G-ÅKª÷ÄݧM·Ò
CNS 8397:1998
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¼u®¥Î¤£ù׿û½u
Stainless steel wires for s
p
ring
- English Version
G-ÅKª÷ÄݧM·Ò
CNS 8399:1998
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¼u®¥Î§Nªî¤£ù׿û¿û±a
Cold rolled stainless steel stri
p
for s
p
rings
- English Version
T-½Ã¥Í¤ÎÂåÀø¾¹§÷
CNS 8065:1998
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¤ú¬ì¥Î¤â¾÷±µÀY¤Ø«×
Dental hand
p
ieces-cou
p
ling dimensions
- English Version
Z-#N/A
CNS 4120:1998
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¶WµªiÀË´ú¥Î¢Õ«¬¼Ð·Ç³W¶ô
Ty
p
e G standard test block for ultrasonic normal beam testing
- English Version
B-¾÷±ñ¤uµ{
CNS 4295:1998
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Assembly tools for screws and nuts - Double-ended wrenches - Sizing
p
airing
- English Version
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C-¹q¾÷¤uµ{, ¹q¤l¤uµ{
CNS 4899:1997
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¹q¤l³]³Æ¥Î©T©w¹qªý¾¹ÀËÅçªk
Test methods of fixed resistors for use in electronic equi
p
ment
- English Version
C-¹q¾÷¤uµ{, ¹q¤l¤uµ{
CNS 7357:1997
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»E¤A²m¾JÁY¥ÒîǺ£¥]¾T½u
Polyvinyl formal enamelled round aluminium winding wires
- English Version
C-¹q¾÷¤uµ{, ¹q¤l¤uµ{
CNS 13992:1997
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Fixed resistor networks in which not all resistors are individually measurable for use in electronic equi
p
ment
- English Version
C-¹q¾÷¤uµ{, ¹q¤l¤uµ{
CNS 13811:1997
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µo¥ú¤G·¥Å鼯¦r«¬¤Ï®g®MªO
Numerical-Ty
p
e Reflectors for Light Emitting Diodes
- English Version
T-½Ã¥Í¤ÎÂåÀø¾¹§÷
CNS 13999:1997
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¯ß½Ä¦¡¤Ï®gªk¶Wµªi¶EÂ_¸Ë¸mÀËÅçªk
General methods of measuring the
p
erformances of ultrasonic
p
ulse-echo diagnostic equi
p
ment
- English Version
C-¹q¾÷¤uµ{, ¹q¤l¤uµ{
CNS 6066:1997
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¦Û¿Ä©Ê»EÓiຣ¥]¶ê»É¶²Õ½u
Self-bonding
p
olyurethane enamelled round co
p
p
er winding wires
- English Version
T-½Ã¥Í¤ÎÂåÀø¾¹§÷
CNS 14101:1997
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¢Ï«¬¶Wµªi¶EÂ_¸Ë¸m
A-mode ultrasonic diagnostic equi
p
ment
- English Version
C-¹q¾÷¤uµ{, ¹q¤l¤uµ{
CNS 13902:1997
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³±·¥®g½u¥Üªi¾¹¯S©Ê
Ex
p
ression of the
p
ro
p
erties of cathode-ray oscillosco
p
es
- English Version
B-¾÷±ñ¤uµ{
CNS 13989-6:1997
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¥Í²£¦Û°Ê¤Æ»P®w¦sºÞ²zµü·J¡]¦³Ãö±ÄÁʤ§¦Wµü¡^
Glossary of terms for
p
roduction automation and inventory management (Terms of
p
urchase)
- English Version
T-½Ã¥Í¤ÎÂåÀø¾¹§÷
CNS 14102:1997
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¤â°Ê±½´y¢Ð«¬¶Wµªi¶EÂ_¸Ë¸m
Manual scanning B-mode ultrasonic diagnostic equi
p
ment
- English Version
C-¹q¾÷¤uµ{, ¹q¤l¤uµ{
CNS 13903:1997
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Àx¦s¦¡³±·¥®g½u¥Üªi¾¹¯S©Ê
Ex
p
ression of the
p
ro
p
erties of storage cathode-ray oscillosco
p
es
- English Version
C-¹q¾÷¤uµ{, ¹q¤l¤uµ{
CNS 13904:1997
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¨ú¼Ë¥Üªi¾¹¯S©Ê
Ex
p
ression of the
p
ro
p
erties of sam
p
ling oscillosco
p
es
- English Version
C-¹q¾÷¤uµ{, ¹q¤l¤uµ{
CNS 13808:1997
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µo¥ú¤G·¥Åé½U´¹¤ù
E
p
itaxial Wafers for Light Emitting Diodes
- English Version
C-¹q¾÷¤uµ{, ¹q¤l¤uµ{
CNS 13991:1997
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¹q¤l³]³Æ¥Î¥i³æ¿W¶q´úÓ§O¹qªý¤¸¥ó¤§©T©wºô¸ô¹qªý¾¹
Fixed resistor networks with individually measurable resistors for use in electronic equi
p
ment
- English Version
C-¹q¾÷¤uµ{, ¹q¤l¤uµ{
CNS 13807:1997
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µo¥ú¤G·¥Åé¥ÎÀô®ñ¾ð¯×¸ÕÅçªk
Methods of Test of E
p
oxy for Light Emitting Diodes
- English Version
C-¹q¾÷¤uµ{, ¹q¤l¤uµ{
CNS 13622:1997
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¹q¤l³]³Æ¥Î©T©w´¹¤ù¹qªý¾¹
Fixed chi
p
resistor for use in electronic equi
p
ment
- English Version
B-¾÷±ñ¤uµ{
CNS 13989-5:1997
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¥Í²£¦Û°Ê¤Æ»P®w¦sºÞ²zµü·J¡]¦³Ãö¹w´ú¤§¦Wµü¡^
Glossary of terms for
p
roduction automation and inventory management (Terms of forecast)
- English Version
B-¾÷±ñ¤uµ{
CNS 13989-4:1997
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¥Í²£¦Û°Ê¤Æ»P®w¦sºÞ²zµü·J¡]¦³Ãö²£¯à³W¹º¤§¦Wµü¡^
Glossary of terms for
p
roduction automation and inventory management (Terms of ca
p
acity
p
lanning)
- English Version
C-¹q¾÷¤uµ{, ¹q¤l¤uµ{
CNS 13806:1997
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µo¥ú¤G·¥Åé½U´¹¤ùµo¥úªiªø»P«G«×¶q´úªk
Method of Measurement for Emission Wavelength and Luminous Intensity of E
p
itaxial Wafers of Light Emitting Diodes
- English Version
C-¹q¾÷¤uµ{, ¹q¤l¤uµ{
CNS 13805:1997
- ^¤åª©
¥ú¹q¥b¾ÉÅé´¹¶ê¤§¥ú¿E¥úÃжq´úªk
Method of Measurement for Photoluminescence of O
p
toelectronic Semiconductor Wafers
- English Version
B-¾÷±ñ¤uµ{
CNS 13989-3:1997
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¥Í²£¦Û°Ê¤Æ»P®w¦sºÞ²zµü·J¡]¦³Ãö¥Í²£ºÞ²z¤§¦Wµü¡^
Glossary of terms for
p
roduction automation and inventory management (Terms of
p
roduction management)
- English Version
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