"Semi" CNS Standards List| Manganese Dry | T Slot | Codes the | Marine Malleable | Metallic Other | Test Code | Method test | Studs, Metal | |
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CNS 15476
2021 Edition Method of test for density of Semi-solid bituminous materials (Pycnometer method) 半固態瀝青材料密度試驗法(比重瓶法) |
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CNS 7567
2021 Edition Semi - Tubular Pan Head Rivets Nominal Diameters 1.6 to 10 mm 短空心盤頭鉚釘（標稱直徑１．６至１０ｍｍ） |
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CNS 15377
2021 Edition Fine ceramics − Ultraviolet light source for testing Semiconducting photocatalytic materials 精密陶瓷－紫外線光源用於半導體光觸媒材料測試 |
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CNS 7568
2021 Edition Semi - Tubular Countersunk Head Rivets Nominal Diameters 1.6 to 10mm 短空心平頂埋頭鉚釘，標稱直徑１．６至１０ｍｍ |
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CNS 13802-5
2021 Edition Graphical Symbols for Diagrams (Semiconductors and Electron Tubes) 電機工程製圖符號（半導體及電子管） |
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CNS 1858
2020 Edition PhenylSemicarbazide 化學試藥（苯基胺脲） |
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CNS 7030
2020 Edition Shapes and Dimensions of Fifth Wheel Coupling Pins for Semi-trailers 半拖車用第五輪聯結銷之形狀及尺度 |
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CNS 152
2020 Edition Semi-Finished Washers (for Bolts with Cylindrical and pan Head and Nuts) 半光（輾光）製墊圈（用於柱頭、半圓頭螺釘及螺帽Ｍ１至Ｍ２０） |
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CNS 151
2020 Edition Semi - Finished Washers (for Hexagonal Bolts and Nuts: M1 -M20) 半光（輾光）製墊圈（用於六角螺釘及螺帽Ｍ１至Ｍ２０） |
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CNS 2018
2020 Edition ThioSemicarbazide 化學試藥（氨基硫脲） |
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CNS 3122
2019 Edition Hexagon head screws − Product finished and Semi-finished 六角頭螺釘－產品等級精製及半精製 |
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CNS 15187-4
2019 Edition Low-voltage fuses - Part 4: Supplementary requirements for fuse-links for the protection of Semiconductor devices 低壓熔線－第４部︰半導體裝置保護用熔線鏈之補充規定 |
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CNS 8238
2019 Edition Interchange Coupling Dimensions of Truck Tractors and Semitrailers 貨車牽引車及半搭拖車連接部之尺度 |
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CNS 3121
2019 Edition Hexagon head bolts – Product finished and Semi-finished 六角頭螺栓－產品等級精製及半精製 |
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CNS 13308
2019 Edition Method of Test for Fifth Wheel Coupling Pins of Semi - Trailers 半拖車用第五輪聯結銷檢驗法 |
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CNS 15187-4-1
2019 Edition Low-voltage fuses - Part 4-1: Supplementary requirements for fuse-links for the protection of Semiconductor devices - Sections I to III : Examples of types of standardized fuse-links 低壓熔線－第４－１部︰半導體裝置保護用熔線鏈之補充規定－第Ｉ章至第ＩＩＩ章︰經標準化之熔線鏈各種類型範例 |
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CNS 6127
2017 Edition General Rules for Reliability Assured Discrete Semiconductor Devices 可靠度保證單件半導體裝置總則 |
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CNS 13623
2017 Edition Test Methods for Measuring Resistivity,Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors(Van Der Pauw Method) 單晶片之電阻率、霍爾係數及霍爾移動率之測定法（范德普法） |
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CNS 14657
2017 Edition Acoustics - Determination of sound power levels of noise sources - Precision methods for anechoic and Semi-anechoic rooms 聲學─測定噪音源聲功率位準的精密級方法─用於無響室和半無響室 |
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CNS 11900
2017 Edition Fixed Ceramic Capacitors for Electronic Equipment (Semiconductor) 電子設備用陶瓷固定電容器（半導體） |
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CNS 3135
2017 Edition Square Head Bolts (Semi-finished) 方頭螺栓（次精製） |
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CNS 4320
2017 Edition Hexagon Head Bolts, Finished and Semi-Finished, Metric Fine Thread 六角頭螺栓（精製及半精制，公制細螺紋） |
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CNS 4321
2017 Edition Hexagon Bolts with Approximately to Head, Finished and Semi-Finished, Metric Fine Thread 六角頭全螺紋螺栓（精製及半精製，公制細螺紋） |
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CNS 6137
2017 Edition Color Coding of Discrete Semiconductor Devices 個別半導體元件之色碼 |
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CNS 12678
2017 Edition Semi-Automatic Strapping Machines 半自動捆包機 |
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CNS 13805
2017 Edition Method of Measurement for Photoluminescence of Optoelectronic Semiconductor Wafers 光電半導體晶圓之光激光譜量測法 |
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CNS 16000-25
2016 Edition Indoor air − Part 25: Determination of the emission of Semi-volatile organic compounds by building products − Micro-chamber method 室內空氣－第25 部：建築產品逸散半揮發性有機化合物之測定－微型容器法 |
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CNS 16000-25
2016 Edition Indoor air − Part 25: Determination of the emission of Semi-volatile organic compounds by building products − Micro-chamber method 室內空氣－第25部：建築產品逸散半揮發性有機化合物之測定－微型容器法 |
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CNS 14657
2002 Edition Acoustics - Determination of sound power levels of noise sources - Precision methods for anechoic and Semi-anechoic rooms 聲學－測定噪音源聲功率位準的精密級方法－用於無響室和半無響室 |
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CNS 13805
1997 Edition Method of Measurement for Photoluminescence of Optoelectronic Semiconductor Wafers 光電半導體晶圓之光激光譜量測法 |
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