"Embossed " CNS Standards List| Measuring Methods | Method Rough | Method test | Method Test | Low Voltage | High boots | Crystalline silicon | Method Test | |
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CNS 12821-3
2018 Edition Identification Cards-Recording Technique-Part 3 : Location of Embossed Characters on ID-1 Cards 識別卡（登錄技術第３部，ＩＤ–１型卡片壓刻字元位置） |
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