"H " CNS Standards List |
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CNS 11785
1997 Edition MetHod of test for monitor 監視器檢驗法 |
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CNS 13808
1997 Edition Epitaxial Wafers for LigHt Emitting Diodes 發光二極體磊晶片 |
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CNS 13809
1997 Edition LigHt Emitting Diode Dice 發光二極體晶粒 |
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CNS 13804
1997 Edition Guidance on tHe Use of the Substitution Method for Measurements of Radiation from Microwave Ovens for Frequencies above 1 GHz 應用置換法測量微波爐1GHz以上之輻射指引 |
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CNS 13811
1997 Edition Numerical-Type Reflectors for LigHt Emitting Diodes 發光二極體數字型反射套板 |
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CNS 13903
1997 Edition Expression of tHe properties of storage cathode-ray oscilloscopes 儲存式陰極射線示波器特性 |
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CNS 13622
1997 Edition Fixed cHip resistor for use in electronic equipment 電子設備用固定晶片電阻器 |
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CNS 13904
1997 Edition Expression of tHe properties of sampling oscilloscopes 取樣示波器特性 |
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CNS 13902
1997 Edition Expression of tHe properties of cathode-ray oscilloscopes 陰極射線示波器特性 |
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CNS 13792
1996 Edition Measuring MetHods of Optical Polarizer for Communication 通信用光極化器量測法 |
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CNS 13800
1996 Edition PHotography-Processed Photographic Black-and-White Film for Archival Records-Silver-Gelatin Type on Poly (Ethylene Terephthalate) Base-Specification 照相技術－顯像處理完畢之存檔底片－銀鹽膠膜聚酯纖維片基底片－基本規格 |
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CNS 13791
1996 Edition Measuring MetHods of Optical Attenuator for Communication 通信用光衰減器量測法 |
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CNS 8839
1996 Edition MetHods of Test for Refractive Index of Chemical Products 化學製品折射率測定法 |
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CNS 13724
1996 Edition MetHod of Test for Pull Strength of Microelectronic Wire Bonds 微電子銲線拉力試驗法 |
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CNS 13720
1996 Edition MicrograpHics-ISO Resolution Test Chart No 2-Description and Use 微縮技術－國際標準組織二號解像率測試卡－結構與應用 |
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CNS 13790
1996 Edition Measuring MetHods of Fiber Optical Branching Components for Communication 通信用光分歧元件量測法 |
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CNS 13655
1996 Edition Reliability Testing for PHotodiode(for Communication) 通信用光二極體之可靠度測試 |
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CNS 13722
1996 Edition Documentation-Headers for Microfiche of Monographs and Serials 文獻－圖書與期刊的微縮單片標題 |
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CNS 13754
1996 Edition Corrosion of Metals and Alloys-Corrosivity of AtmospHeres-Measurement of Pollution 金屬及合金之腐蝕－大氣腐蝕性(污染之測定) |
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CNS 9180
1996 Edition MetHods of Test for Distillation of Chemical Products 化學製品蒸餾測定法 |
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CNS 13793
1996 Edition Measuring MetHods of Optical Isolators for Communication 通信用光隔離器量測法 |
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CNS 13725
1996 Edition MetHod of Nondestructive Test for Microelectronic Wire Bonds 微電子銲線之非破壞性拉力試驗法 |
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CNS 13726
1996 Edition MetHod of Test for Shear Strength of Dil Bond 晶粒固著強度試驗法 |
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CNS 13656
1996 Edition Lot-Control Testing for PHotodiode(for Communication) 通信用光二極體之批品質控制測試 |
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CNS 13780
1996 Edition Endurance Testing MetHods for Infrared Emitting Diodes (for Automation)-Continuously Applying Voltage Test 自動控制用紅外發光二極體耐久性試驗法－連續通電試驗 |
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CNS 13779
1996 Edition Measuring MetHods for Infrared Emitting Diodes (IRED)(for Automation) 自動控制用紅外發光二極體量測法 |
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CNS 13727
1996 Edition MetHod of Test for Volume Resistivity of Conductive Adhesives 導電膠之體積電阻率量測法 |
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CNS 13781
1996 Edition Endurance Testing MetHods for Infrared Emitting Diodes (for Automation)-Burn-In Test (Forward Bias) 自動控制用紅外發光二極體耐久性試驗法－預燒試驗（順向偏壓） |
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CNS 8558
1996 Edition Aluminium Conductor Polyvinyl CHloride Insulated Service Drop Wires 鋁導體聚氯乙烯絕緣接戶線(A1-DV，ACSR-DV) |
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CNS 13652
1996 Edition Reliability Testing for LigHt Emitting Diode(for Communication) 通信用發光二極體之可靠度測試 |
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