"or " CNS Standards List |
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CNS 11299-5
1997 Edition Glossary of terms for sensing and transducing (Terms of measurement signal processing for general instrument technology) 感測與轉換詞彙(有關一般儀表技術之量測信號處理名詞) |
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CNS 11299-4
1997 Edition Glossary of terms for sensing and transducing (Terms of signal computations for general instrument technology) 感測與轉換詞彙(有關一般儀表技術之信號運算名詞) |
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CNS 11299-3
1997 Edition Glossary of terms for sensing and transducing (Terms of fundamental concept of trransducing for general instrument technology) 感測與轉換詞彙(有關一般儀表技術之轉換基本觀念名詞) |
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CNS 11299-2
1997 Edition Glossary of terms for sensing and transducing (Terms of fundamental concept of senaing for general instrument technology) 感測與轉換詞彙(有關一般儀表技術之感測基本觀念名詞) |
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CNS 11299-1
1997 Edition Glossary of terms for sensing and transducing (Terms of fundamental concept of measurement system for general instrument technology) 感測與轉換詞彙(有關一般儀表技術之量測系統基本觀念名詞) |
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CNS 13622
1997 Edition Fixed chip resistor for use in electronic equipment 電子設備用固定晶片電阻器 |
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CNS 13999
1997 Edition General methods of measuring the performances of ultrasonic pulse-echo diagnostic equipment 脈衝式反射法超音波診斷裝置檢驗法 |
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CNS 4899
1997 Edition Test methods of fixed resistors for use in electronic equipment 電子設備用固定電阻器檢驗法 |
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CNS 13811
1997 Edition Numerical-Type Reflectors for Light Emitting Diodes 發光二極體數字型反射套板 |
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CNS 10760
1997 Edition Method of test for flammability of treated paper and paperboard 加工處理紙及紙板防焰性試驗 |
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CNS 11785
1997 Edition Method of test for monitor 監視器檢驗法 |
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CNS 13804
1997 Edition Guidance on the Use of the Substitution Method for Measurements of Radiation from Microwave Ovens for Frequencies above 1 GHz 應用置換法測量微波爐1GHz以上之輻射指引 |
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CNS 13805
1997 Edition Method of Measurement for Photoluminescence of Optoelectronic Semiconductor Wafers 光電半導體晶圓之光激光譜量測法 |
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CNS 13806
1997 Edition Method of Measurement for Emission Wavelength and Luminous Intensity of Epitaxial Wafers of Light Emitting Diodes 發光二極體磊晶片發光波長與亮度量測法 |
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CNS 13807
1997 Edition Methods of Test of Epoxy for Light Emitting Diodes 發光二極體用環氧樹脂試驗法 |
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CNS 13808
1997 Edition Epitaxial Wafers for Light Emitting Diodes 發光二極體磊晶片 |
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CNS 13810
1997 Edition Lead Frames for Light Emitting Diodes 發光二極體用支架 |
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CNS 13780
1996 Edition Endurance Testing Methods for Infrared Emitting Diodes (for Automation)-Continuously Applying Voltage Test 自動控制用紅外發光二極體耐久性試驗法－連續通電試驗 |
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CNS 8838
1996 Edition Methods of Test for Loss and Residue of Chemical Products 化學製品減量及殘留分測定法 |
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CNS 8834
1996 Edition Methods of Test for Density and Relative Density (Specific Gravity) of Chemical Products 化學製品密度及比重測定法 |
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CNS 13653
1996 Edition Lot-Control Testing for Light Emitting Diode(for Communication) 通信用發光二極體之批品質控制測試 |
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CNS 13754
1996 Edition Corrosion of Metals and Alloys-Corrosivity of Atmospheres-Measurement of Pollution 金屬及合金之腐蝕－大氣腐蝕性(污染之測定) |
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CNS 13652
1996 Edition Reliability Testing for Light Emitting Diode(for Communication) 通信用發光二極體之可靠度測試 |
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CNS 13654
1996 Edition Measuring Methods for Photodiode(for Communication) 通信用光二極體量測法 |
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CNS 13800
1996 Edition Photography-Processed Photographic Black-and-White Film for Archival Records-Silver-Gelatin Type on Poly (Ethylene Terephthalate) Base-Specification 照相技術－顯像處理完畢之存檔底片－銀鹽膠膜聚酯纖維片基底片－基本規格 |
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CNS 13801
1996 Edition Photography-Processed Photographic Black-and-White Film for Archival Records-Silver-Gelatin Type on Cellulose Ester Base-Specifications 照相技術－顯像處理完畢之存檔底片－銀鹽膠膜纖維素酯片基底片－基本規格 |
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CNS 13651
1996 Edition Measuring Methods for Light Emitting Diode(for Communication) 通信用發光二極體量測法 |
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CNS 13781
1996 Edition Endurance Testing Methods for Infrared Emitting Diodes (for Automation)-Burn-In Test (Forward Bias) 自動控制用紅外發光二極體耐久性試驗法－預燒試驗（順向偏壓） |
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CNS 13782
1996 Edition Realiability Assured Infrared Emitting Diodes (IRED)(for Automation) 自動控制用可靠度保證紅外發光二極體 |
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CNS 8835
1996 Edition Methods of Test for Melting Point and Melting Range of Chemical Products 化學製品熔點及熔融範圍測定法 |
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