"IC " CNS Standards List |
|
CNS 4121
1998 Edition Type N1 standard test block for ultrasonIC normal beam testing of steel plates 超音波檢測鋼板用N1型標準規塊 |
![]() |
|
|
CNS 12845
1998 Edition Method of straight-beam ultrasonIC test for structure-use steel plate 結構用鋼板超音波直束檢測法 |
![]() |
|
|
CNS 14135
1998 Edition Method of thICkness measurement by ultrasonic pulse echo technique for metals 金屬材料超音波測厚法 |
![]() |
|
|
CNS 4120
1998 Edition Type G standard test block for ultrasonIC normal beam testing 超音波檢測用G型標準規塊 |
![]() |
|
|
CNS 14291
1998 Edition Method of tensile creep rupture test for metallIC materials 金屬材料拉伸潛變破斷試驗法 |
![]() |
|
|
CNS 14290
1998 Edition Method of tensile creep test for metallIC materials 金屬材料拉伸潛變試驗法 |
![]() |
|
|
CNS 4123
1998 Edition Type A2 standard test block for ultrasonIC angle beam testing 超音波斜束檢測用A2型標準規塊 |
![]() |
|
|
CNS 14182
1998 Edition Reliability and lot control tests for analog video laser transmitter and receiver modules used for optICal fiber communication 光纖通信用類比視訊雷射傳輸和接收模組之可靠度及批品質控制測試 |
![]() |
|
|
CNS 4124
1998 Edition Type A3 standard test block for ultrasonIC angle beam testing 超音波斜束檢測用A3型標準規塊 |
![]() |
|
|
CNS 14181
1998 Edition Measurement methods for the performance of analog video laser transmitter and receiver modules used for optICal fiber communication 光纖通信用類比視訊雷射傳輸和接收模組之性能量測法 |
![]() |
|
|
CNS 13804
1997 Edition Guidance on the Use of the Substitution Method for Measurements of Radiation from MICrowave Ovens for Frequencies above 1 GHz 應用置換法測量微波爐1GHz以上之輻射指引 |
![]() Translated |
|
|
CNS 13805
1997 Edition Method of Measurement for Photoluminescence of OptoelectronIC Semiconductor Wafers 光電半導體晶圓之光激光譜量測法 |
![]() |
|
|
CNS 13999
1997 Edition General methods of measuring the performances of ultrasonIC pulse-echo diagnostic equipment 脈衝式反射法超音波診斷裝置檢驗法 |
![]() |
|
|
CNS 14101
1997 Edition A-mode ultrasonIC diagnostic equipment A型超音波診斷裝置 |
![]() |
|
|
CNS 4899
1997 Edition Test methods of fixed resistors for use in electronIC equipment 電子設備用固定電阻器檢驗法 |
![]() |
|
|
CNS 13811
1997 Edition NumerICal-Type Reflectors for Light Emitting Diodes 發光二極體數字型反射套板 |
![]() |
|
|
CNS 13992
1997 Edition Fixed resistor networks in whICh not all resistors are individually measurable for use in electronic equipment 電子設備用不可單獨量測所有電阻元件之固定網路電阻器 |
![]() |
|
|
CNS 12807
1997 Edition Quality Requirement for MICrofilm of Documents and Drawings 微縮品製作-文件及圖面微縮軟片品質之要求 |
![]() |
|
|
CNS 13622
1997 Edition Fixed chip resistor for use in electronIC equipment 電子設備用固定晶片電阻器 |
![]() |
|
|
CNS 13809
1997 Edition Light Emitting Diode DICe 發光二極體晶粒 |
![]() |
|
|
CNS 13941
1997 Edition MICrographics-Microfilming of documents on 16mm and 35mm silver-gelatin type microfilm-Operating procedures 微縮技術-16 mm及35 mm銀鹽片之文件縮攝法-作業程序 |
![]() |
|
|
CNS 12808
1997 Edition Quality Requirement for MICrofilming from Rotary Cameras 微縮品製作-輪轉式縮攝機拍攝微縮軟片品質之要求 |
![]() |
|
|
CNS 3592
1997 Edition NICkel and nickel alloy covered electrodes 鎳及鎳合金被覆銲條 |
![]() |
|
|
CNS 13942
1997 Edition MICrographics-Computer output microfiche (COM)-Microfiche A6 微縮技術-電腦輸出微縮單片(COM)-A6型微縮單片 |
![]() |
|
|
CNS 14102
1997 Edition Manual scanning B-mode ultrasonIC diagnostic equipment 手動掃描B型超音波診斷裝置 |
![]() |
|
|
CNS 13991
1997 Edition Fixed resistor networks with individually measurable resistors for use in electronIC equipment 電子設備用可單獨量測個別電阻元件之固定網路電阻器 |
![]() |
|
|
CNS 4797-5
1996 Edition Toy Safety (ChemICal Toys (Sets) Other Than Experimental Sets) 玩具安全(非實驗套組之化學玩具套組) |
![]() Translated |
|
|
CNS 13652
1996 Edition Reliability Testing for Light Emitting Diode(for CommunICation) 通信用發光二極體之可靠度測試 |
![]() |
|
|
CNS 13651
1996 Edition Measuring Methods for Light Emitting Diode(for CommunICation) 通信用發光二極體量測法 |
![]() |
|
|
CNS 13650
1996 Edition Lot-Control Testing for Laser Diode(for CommunICation) 通信用雷射二極體之批品質控制測試 |
![]() |
Find out:6418Items | To Page of: First -Previous-Next -Last | [183] [184] [185] [186] [187] [188] [189] |