"3 " CNS Standards List |
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CNS 7357
1997 Edition Polyvinyl formal enamelled round aluminium winding wires 聚乙烯醇縮甲醛漆包鋁線 |
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CNS 13991
1997 Edition Fixed resistor networks with individually measurable resistors for use in electronic equipment 電子設備用可單獨量測個別電阻元件之固定網路電阻器 |
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CNS 13992
1997 Edition Fixed resistor networks in which not all resistors are individually measurable for use in electronic equipment 電子設備用不可單獨量測所有電阻元件之固定網路電阻器 |
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CNS 13989-5
1997 Edition Glossary of terms for production automation and inventory management (Terms of forecast) 生產自動化與庫存管理詞彙（有關預測之名詞） |
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CNS 13942
1997 Edition Micrographics-Computer output microfiche (COM)-Microfiche A6 微縮技術－電腦輸出微縮單片(COM)-A6型微縮單片 |
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CNS 13989-6
1997 Edition Glossary of terms for production automation and inventory management (Terms of purchase) 生產自動化與庫存管理詞彙（有關採購之名詞） |
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CNS 13807
1997 Edition Methods of Test of Epoxy for Light Emitting Diodes 發光二極體用環氧樹脂試驗法 |
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CNS 3510
1997 Edition Copper and copper alloy covered electrodes 銅及銅合金被覆銲條 |
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CNS 13804
1997 Edition Guidance on the Use of the Substitution Method for Measurements of Radiation from Microwave Ovens for Frequencies above 1 GHz 應用置換法測量微波爐1GHz以上之輻射指引 |
Translated |
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CNS 13805
1997 Edition Method of Measurement for Photoluminescence of Optoelectronic Semiconductor Wafers 光電半導體晶圓之光激光譜量測法 |
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CNS 13806
1997 Edition Method of Measurement for Emission Wavelength and Luminous Intensity of Epitaxial Wafers of Light Emitting Diodes 發光二極體磊晶片發光波長與亮度量測法 |
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CNS 3510-1
1997 Edition Copper and copper alloy gas welding rods 銅及銅合金氣銲條 |
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CNS 13811
1997 Edition Numerical-Type Reflectors for Light Emitting Diodes 發光二極體數字型反射套板 |
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CNS 8836
1996 Edition Method of Test for Freezing Point of Chemical Products 化學製品凝固點測定法 |
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CNS 8834
1996 Edition Methods of Test for Density and Relative Density (Specific Gravity) of Chemical Products 化學製品密度及比重測定法 |
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CNS 13720
1996 Edition Micrographics-ISO Resolution Test Chart No 2-Description and Use 微縮技術－國際標準組織二號解像率測試卡－結構與應用 |
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CNS 8835
1996 Edition Methods of Test for Melting Point and Melting Range of Chemical Products 化學製品熔點及熔融範圍測定法 |
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CNS 13781
1996 Edition Endurance Testing Methods for Infrared Emitting Diodes (for Automation)-Burn-In Test (Forward Bias) 自動控制用紅外發光二極體耐久性試驗法－預燒試驗（順向偏壓） |
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CNS 13653
1996 Edition Lot-Control Testing for Light Emitting Diode(for Communication) 通信用發光二極體之批品質控制測試 |
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CNS 13654
1996 Edition Measuring Methods for Photodiode(for Communication) 通信用光二極體量測法 |
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CNS 13656
1996 Edition Lot-Control Testing for Photodiode(for Communication) 通信用光二極體之批品質控制測試 |
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CNS 13723
1996 Edition Extensometers Used in Metallic Material Tensile 金屬材料拉伸試驗用伸長計 |
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CNS 13724
1996 Edition Method of Test for Pull Strength of Microelectronic Wire Bonds 微電子銲線拉力試驗法 |
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CNS 13725
1996 Edition Method of Nondestructive Test for Microelectronic Wire Bonds 微電子銲線之非破壞性拉力試驗法 |
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CNS 13726
1996 Edition Method of Test for Shear Strength of Dil Bond 晶粒固著強度試驗法 |
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CNS 13727
1996 Edition Method of Test for Volume Resistivity of Conductive Adhesives 導電膠之體積電阻率量測法 |
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CNS 11395
1996 Edition Method of Test for Stiffness of Paper and Paperboard(Taber Stiffness Tester) 紙及紙板剛度試驗法（Taber剛度試驗機） |
Translated |
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CNS 13652
1996 Edition Reliability Testing for Light Emitting Diode(for Communication) 通信用發光二極體之可靠度測試 |
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CNS 13780
1996 Edition Endurance Testing Methods for Infrared Emitting Diodes (for Automation)-Continuously Applying Voltage Test 自動控制用紅外發光二極體耐久性試驗法－連續通電試驗 |
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CNS 13655
1996 Edition Reliability Testing for Photodiode(for Communication) 通信用光二極體之可靠度測試 |
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