"3 " CNS Standards List| Grades Green | Methods determination | Method test | Open Systems | Double capped | Glossary terms | Method Test | Financial transaction | |
|
CNS 3592
1997 Edition Nickel and nickel alloy covered electrodes 鎳及鎳合金被覆銲條 |
|
|
|
CNS 13989-5
1997 Edition Glossary of terms for production automation and inventory management (Terms of forecast) 生產自動化與庫存管理詞彙（有關預測之名詞） |
|
|
|
CNS 13992
1997 Edition Fixed resistor networks in which not all resistors are individually measurable for use in electronic equipment 電子設備用不可單獨量測所有電阻元件之固定網路電阻器 |
|
|
|
CNS 13989-6
1997 Edition Glossary of terms for production automation and inventory management (Terms of purchase) 生產自動化與庫存管理詞彙（有關採購之名詞） |
|
|
|
CNS 13622
1997 Edition Fixed chip resistor for use in electronic equipment 電子設備用固定晶片電阻器 |
|
|
|
CNS 2183
1997 Edition Polyester enamelled round copper winding wires 聚酯漆包銅線 |
Translated |
|
|
CNS 13903
1997 Edition Expression of the properties of storage cathode-ray oscilloscopes 儲存式陰極射線示波器特性 |
|
|
|
CNS 13942
1997 Edition Micrographics-Computer output microfiche (COM)-Microfiche A6 微縮技術－電腦輸出微縮單片(COM)-A6型微縮單片 |
|
|
|
CNS 13941
1997 Edition Micrographics-Microfilming of documents on 16mm and 35mm silver-gelatin type microfilm-Operating procedures 微縮技術－16 mm及35 mm銀鹽片之文件縮攝法－作業程序 |
|
|
|
CNS 13805
1997 Edition Method of Measurement for Photoluminescence of Optoelectronic Semiconductor Wafers 光電半導體晶圓之光激光譜量測法 |
|
|
|
CNS 13804
1997 Edition Guidance on the Use of the Substitution Method for Measurements of Radiation from Microwave Ovens for Frequencies above 1 GHz 應用置換法測量微波爐1GHz以上之輻射指引 |
Translated |
|
|
CNS 13991
1997 Edition Fixed resistor networks with individually measurable resistors for use in electronic equipment 電子設備用可單獨量測個別電阻元件之固定網路電阻器 |
|
|
|
CNS 3471
1997 Edition PE-insulated pair type aluminium tape shield,PE-sheathed,telephone cable 聚乙烯絕緣鋁帶聚乙烯被覆市內對型電話電纜 |
Translated |
|
|
CNS 13654
1996 Edition Measuring Methods for Photodiode(for Communication) 通信用光二極體量測法 |
|
|
|
CNS 8839
1996 Edition Methods of Test for Refractive Index of Chemical Products 化學製品折射率測定法 |
|
|
|
CNS 13754
1996 Edition Corrosion of Metals and Alloys-Corrosivity of Atmospheres-Measurement of Pollution 金屬及合金之腐蝕－大氣腐蝕性(污染之測定) |
|
|
|
CNS 13648
1996 Edition Measuring Methods for Laser Diode(for Communication) 通信用雷射二極體量測法 |
|
|
|
CNS 13649
1996 Edition Reliability Testing for Laser Diode(for Communication) 通信用雷射二極體之可靠度測試 |
|
|
|
CNS 8838
1996 Edition Methods of Test for Loss and Residue of Chemical Products 化學製品減量及殘留分測定法 |
|
|
|
CNS 13725
1996 Edition Method of Nondestructive Test for Microelectronic Wire Bonds 微電子銲線之非破壞性拉力試驗法 |
|
|
|
CNS 13650
1996 Edition Lot-Control Testing for Laser Diode(for Communication) 通信用雷射二極體之批品質控制測試 |
|
|
|
CNS 13801
1996 Edition Photography-Processed Photographic Black-and-White Film for Archival Records-Silver-Gelatin Type on Cellulose Ester Base-Specifications 照相技術－顯像處理完畢之存檔底片－銀鹽膠膜纖維素酯片基底片－基本規格 |
|
|
|
CNS 13651
1996 Edition Measuring Methods for Light Emitting Diode(for Communication) 通信用發光二極體量測法 |
|
|
|
CNS 13652
1996 Edition Reliability Testing for Light Emitting Diode(for Communication) 通信用發光二極體之可靠度測試 |
|
|
|
CNS 13655
1996 Edition Reliability Testing for Photodiode(for Communication) 通信用光二極體之可靠度測試 |
|
|
|
CNS 13720
1996 Edition Micrographics-ISO Resolution Test Chart No 2-Description and Use 微縮技術－國際標準組織二號解像率測試卡－結構與應用 |
|
|
|
CNS 8836
1996 Edition Method of Test for Freezing Point of Chemical Products 化學製品凝固點測定法 |
|
|
|
CNS 13724
1996 Edition Method of Test for Pull Strength of Microelectronic Wire Bonds 微電子銲線拉力試驗法 |
|
|
|
CNS 8837
1996 Edition Methods of Test for Optical Rotation of Chemical Products 化學製品旋光度測定法 |
|
|
|
CNS 13656
1996 Edition Lot-Control Testing for Photodiode(for Communication) 通信用光二極體之批品質控制測試 |
|
| Find out:6360Items | To Page of: First -Previous-Next -Last | [180] [181] [182] [183] [184] [185] [186] |
