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Chinese National Standards
中華民國國家標準
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"3 " CNS Standards List

| Method Disassembly | Fasteners − | Method break | Textiles − | Method test | Method Test | Textile glass | External Bound |

B-Mechanical Engineering
CNS 13989-6    1997 Edition
Glossary of terms for production automation and inventory management (Terms of purchase)
生產自動化與庫存管理詞彙(有關採購之名詞)
C-Electrical Engineering
CNS 13807    1997 Edition
Methods of Test of Epoxy for Light Emitting Diodes
發光二極體用環氧樹脂試驗法
Z-#N/A
CNS 3510    1997 Edition
Copper and copper alloy covered electrodes
銅及銅合金被覆銲條
C-Electrical Engineering
CNS 13903    1997 Edition
Expression of the properties of storage cathode-ray oscilloscopes
儲存式陰極射線示波器特性
C-Electrical Engineering
CNS 13806    1997 Edition
Method of Measurement for Emission Wavelength and Luminous Intensity of Epitaxial Wafers of Light Emitting Diodes
發光二極體磊晶片發光波長與亮度量測法
C-Electrical Engineering
CNS 3471    1997 Edition
PE-insulated pair type aluminium tape shield,PE-sheathed,telephone cable
聚乙烯絕緣鋁帶聚乙烯被覆市內對型電話電纜

Translated
C-Electrical Engineering
CNS 13992    1997 Edition
Fixed resistor networks in which not all resistors are individually measurable for use in electronic equipment
電子設備用不可單獨量測所有電阻元件之固定網路電阻器
C-Electrical Engineering
CNS 13805    1997 Edition
Method of Measurement for Photoluminescence of Optoelectronic Semiconductor Wafers
光電半導體晶圓之光激光譜量測法
C-Electrical Engineering
CNS 13904    1997 Edition
Expression of the properties of sampling oscilloscopes
取樣示波器特性
C-Electrical Engineering
CNS 13991    1997 Edition
Fixed resistor networks with individually measurable resistors for use in electronic equipment
電子設備用可單獨量測個別電阻元件之固定網路電阻器
C-Electrical Engineering
CNS 13808    1997 Edition
Epitaxial Wafers for Light Emitting Diodes
發光二極體磊晶片
Z-#N/A
CNS 13942    1997 Edition
Micrographics-Computer output microfiche (COM)-Microfiche A6
微縮技術-電腦輸出微縮單片(COM)-A6型微縮單片
Z-#N/A
CNS 13941    1997 Edition
Micrographics-Microfilming of documents on 16mm and 35mm silver-gelatin type microfilm-Operating procedures
微縮技術-16 mm及35 mm銀鹽片之文件縮攝法-作業程序
C-Electrical Engineering
CNS 13727    1996 Edition
Method of Test for Volume Resistivity of Conductive Adhesives
導電膠之體積電阻率量測法
K-Chemical Industry
CNS 8835    1996 Edition
Methods of Test for Melting Point and Melting Range of Chemical Products
化學製品熔點及熔融範圍測定法
C-Electrical Engineering
CNS 13792    1996 Edition
Measuring Methods of Optical Polarizer for Communication
通信用光極化器量測法
C-Electrical Engineering
CNS 13791    1996 Edition
Measuring Methods of Optical Attenuator for Communication
通信用光衰減器量測法
C-Electrical Engineering
CNS 13790    1996 Edition
Measuring Methods of Fiber Optical Branching Components for Communication
通信用光分歧元件量測法
C-Electrical Engineering
CNS 13782    1996 Edition
Realiability Assured Infrared Emitting Diodes (IRED)(for Automation)
自動控制用可靠度保證紅外發光二極體
C-Electrical Engineering
CNS 13781    1996 Edition
Endurance Testing Methods for Infrared Emitting Diodes (for Automation)-Burn-In Test (Forward Bias)
自動控制用紅外發光二極體耐久性試驗法-預燒試驗(順向偏壓)
K-Chemical Industry
CNS 3552    1996 Edition
General Rules of Physical Testing Methods for Vulcanized Rubber
硫化橡膠物理試驗法通則
C-Electrical Engineering
CNS 13779    1996 Edition
Measuring Methods for Infrared Emitting Diodes (IRED)(for Automation)
自動控制用紅外發光二極體量測法
C-Electrical Engineering
CNS 13794    1996 Edition
Measuring Methods of Optical Filter for Communication
通信用光濾波器量測法
C-Electrical Engineering
CNS 13726    1996 Edition
Method of Test for Shear Strength of Dil Bond
晶粒固著強度試驗法
C-Electrical Engineering
CNS 13725    1996 Edition
Method of Nondestructive Test for Microelectronic Wire Bonds
微電子銲線之非破壞性拉力試驗法
C-Electrical Engineering
CNS 13724    1996 Edition
Method of Test for Pull Strength of Microelectronic Wire Bonds
微電子銲線拉力試驗法
B-Mechanical Engineering
CNS 13723    1996 Edition
Extensometers Used in Metallic Material Tensile
金屬材料拉伸試驗用伸長計
C-Electrical Engineering
CNS 13656    1996 Edition
Lot-Control Testing for Photodiode(for Communication)
通信用光二極體之批品質控制測試
K-Chemical Industry
CNS 8834    1996 Edition
Methods of Test for Density and Relative Density (Specific Gravity) of Chemical Products
化學製品密度及比重測定法
C-Electrical Engineering
CNS 13780    1996 Edition
Endurance Testing Methods for Infrared Emitting Diodes (for Automation)-Continuously Applying Voltage Test
自動控制用紅外發光二極體耐久性試驗法-連續通電試驗

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