"3 " CNS Standards List| Pressure sensitive | Method Test | Open Systems | Non ignition | 600 V | Method Test | General Terms | Financial transaction | |
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CNS 13810
1997 Edition Lead Frames for Light Emitting Diodes 發光二極體用支架 |
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CNS 13809
1997 Edition Light Emitting Diode Dice 發光二極體晶粒 |
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CNS 13808
1997 Edition Epitaxial Wafers for Light Emitting Diodes 發光二極體磊晶片 |
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CNS 13807
1997 Edition Methods of Test of Epoxy for Light Emitting Diodes 發光二極體用環氧樹脂試驗法 |
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CNS 13806
1997 Edition Method of Measurement for Emission Wavelength and Luminous Intensity of Epitaxial Wafers of Light Emitting Diodes 發光二極體磊晶片發光波長與亮度量測法 |
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CNS 13989-2
1997 Edition Glossary of terms for production automation and inventory management (Terms of material requirements planning) 生產自動化與庫存管理詞彙（有關物料需求規劃之名詞） |
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CNS 13804
1997 Edition Guidance on the Use of the Substitution Method for Measurements of Radiation from Microwave Ovens for Frequencies above 1 GHz 應用置換法測量微波爐1GHz以上之輻射指引 |
Translated |
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CNS 2183
1997 Edition Polyester enamelled round copper winding wires 聚酯漆包銅線 |
Translated |
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CNS 13904
1997 Edition Expression of the properties of sampling oscilloscopes 取樣示波器特性 |
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CNS 13622
1997 Edition Fixed chip resistor for use in electronic equipment 電子設備用固定晶片電阻器 |
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CNS 11299-3
1997 Edition Glossary of terms for sensing and transducing (Terms of fundamental concept of trransducing for general instrument technology) 感測與轉換詞彙(有關一般儀表技術之轉換基本觀念名詞) |
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CNS 13989
1997 Edition Glossary of terms for production automation and inventory management (General) 生產自動化與庫存管理詞彙（一般名詞） |
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CNS 13805
1997 Edition Method of Measurement for Photoluminescence of Optoelectronic Semiconductor Wafers 光電半導體晶圓之光激光譜量測法 |
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CNS 8839
1996 Edition Methods of Test for Refractive Index of Chemical Products 化學製品折射率測定法 |
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CNS 8838
1996 Edition Methods of Test for Loss and Residue of Chemical Products 化學製品減量及殘留分測定法 |
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CNS 8837
1996 Edition Methods of Test for Optical Rotation of Chemical Products 化學製品旋光度測定法 |
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CNS 13754
1996 Edition Corrosion of Metals and Alloys-Corrosivity of Atmospheres-Measurement of Pollution 金屬及合金之腐蝕－大氣腐蝕性(污染之測定) |
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CNS 12937
1996 Edition Structure of Welded SteelTanks for Petroleum Oil Storage 鋼製全熔接石油類儲槽構造 |
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CNS 11395
1996 Edition Method of Test for Stiffness of Paper and Paperboard(Taber Stiffness Tester) 紙及紙板剛度試驗法（Taber剛度試驗機） |
Translated |
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CNS 3509
1996 Edition Covered Electrodes for Hardfacing 硬面銲被覆銲條 |
Translated |
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CNS 13800
1996 Edition Photography-Processed Photographic Black-and-White Film for Archival Records-Silver-Gelatin Type on Poly (Ethylene Terephthalate) Base-Specification 照相技術－顯像處理完畢之存檔底片－銀鹽膠膜聚酯纖維片基底片－基本規格 |
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CNS 13722
1996 Edition Documentation-Headers for Microfiche of Monographs and Serials 文獻－圖書與期刊的微縮單片標題 |
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CNS 13106
1996 Edition Methods of Test for Water Content of Chemical Products 化學製品水分測定法 |
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CNS 13801
1996 Edition Photography-Processed Photographic Black-and-White Film for Archival Records-Silver-Gelatin Type on Cellulose Ester Base-Specifications 照相技術－顯像處理完畢之存檔底片－銀鹽膠膜纖維素酯片基底片－基本規格 |
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CNS 13720
1996 Edition Micrographics-ISO Resolution Test Chart No 2-Description and Use 微縮技術－國際標準組織二號解像率測試卡－結構與應用 |
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CNS 13779
1996 Edition Measuring Methods for Infrared Emitting Diodes (IRED)(for Automation) 自動控制用紅外發光二極體量測法 |
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CNS 8836
1996 Edition Method of Test for Freezing Point of Chemical Products 化學製品凝固點測定法 |
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CNS 13654
1996 Edition Measuring Methods for Photodiode(for Communication) 通信用光二極體量測法 |
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CNS 8835
1996 Edition Methods of Test for Melting Point and Melting Range of Chemical Products 化學製品熔點及熔融範圍測定法 |
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CNS 13655
1996 Edition Reliability Testing for Photodiode(for Communication) 通信用光二極體之可靠度測試 |
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