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Chinese National Standards
中華民國國家標準
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"1,2 " CNS Standards List

C-Electrical Engineering
CNS 9234    1987 Edition
Method of Test for Dry Reed Switches (Standard Test Coils, Single Insulation 130 ℃ Wire)
乾式簧開關檢驗法(130℃單層絕緣線標準試驗線圈)
C-Electrical Engineering
CNS 11877    1987 Edition
Phonograph Pick-Ups with 12.7mm Mounting
12.7 mm安裝孔距之電唱機拾音器
C-Electrical Engineering
CNS 11829    1987 Edition
Light Emitting Diodes (for Indication)
發光二極體(指示用)
C-Electrical Engineering
CNS 10872    1987 Edition
Method of Test for Fiber Optic Devices (FOTP-2 Impact Test)
光纖裝置檢驗法(撞擊試驗FOTP-2)
A-Civil Engineering & Architecture
CNS 11828    1987 Edition
Method of Test for Blast Furnace Slag for Road Construction
道路用高爐爐碴檢驗法

Translated
C-Electrical Engineering
CNS 12121    1987 Edition
Method of Test for Reliability of Video Product
影像產品可靠度檢驗法
Z-#N/A
CNS 11823    1987 Edition
Glossary of Terms Related to Nondestructive Testing (Eddly Current Testing Terms)
非破壞檢測詞彙(渦電流檢測名詞)
P-Pulp & PaperIndustry
CNS 12108    1987 Edition
Method of Test for Acid-Soluble Lignin in Wood and Pulp
木材及紙漿中酸溶性木質素試驗法

Translated
B-Mechanical Engineering
CNS 12068    1987 Edition
Support of Die Casting Molds
壓鑄模用支座
C-Electrical Engineering
CNS 9102    1987 Edition
Symbols of Switch of Interior Wiring Diagram for Architectural Plans
屋內配線設計圖開關類符號
C-Electrical Engineering
CNS 11992    1987 Edition
Method of Test for Fiber Optic Devices (FOTP-42 Optical Crosstalk in Fiber Optic Components)
光纖裝置檢驗法(光纖零組件內之串訊FOTP-42)
C-Electrical Engineering
CNS 11902    1987 Edition
Method of Test for Fiber Optic Devices (FOTP-52 Temperature Dependence of Attenuation for Optical Fibers)
光纖裝置檢驗法(溫度變化對光纖衰減之影響FOTP-52)
C-Electrical Engineering
CNS 9231    1987 Edition
Method of Test for Dry Reed Switches(Physical Dimensions)
乾式簧開關檢驗法(實體尺度)
C-Electrical Engineering
CNS 9112    1987 Edition
Symbols of Telephone and Bell of Interior Wiring Diagram for Architectural Plans
屋內配線設計圖電話、電鈴類符號
C-Electrical Engineering
CNS 12120    1987 Edition
Method of Test for Reliability of Household Audio Product
家用音響產品可靠度檢驗法
C-Electrical Engineering
CNS 12119    1987 Edition
Method of Test for Packaging and Appearance of Audio Product
音響產品包裝、外觀檢驗法
C-Electrical Engineering
CNS 10926    1987 Edition
Method of Test for Fiber Optic Devices (FOTP-27 Measuring Outside (Uncoated) Diameter of Optical Fibers)
光纖裝置檢驗法(無外被光纖外徑測量法FOTP-27)
C-Electrical Engineering
CNS 10927    1987 Edition
Method of Test for Fiber Optic Devices (FOTP-28 Measuring Failure Point of Optical Waveguide Fiber)
光纖裝置檢驗法(光纖抗強拉度測量法FOTP-28)
B-Mechanical Engineering
CNS 11932    1987 Edition
Angle Pins of Molds for Plastics
塑膠型模用角銷
C-Electrical Engineering
CNS 11624    1986 Edition
Crystal Unit、Quartz、CR-84/u、for Radio Oscillation
無線電機振盪用CR-84/u石英晶體
B-Mechanical Engineering
CNS 11612    1986 Edition
Mechanical Grooved Pipe Coupling
機械開槽式管接頭
B-Mechanical Engineering
CNS 5512    1986 Edition
Test Code for Accuracy of Numerically Controlled Machine Tools
數值控制工具機精度檢驗通則
C-Electrical Engineering
CNS 7660    1986 Edition
Method of Test for Low Frequency (Below 3 MHz) Electrical Connectors (TP - 21 Insulation Resistance)
頻率3 MHz以下電連接器檢驗法(絕緣電阻T-21)
C-Electrical Engineering
CNS 11625    1986 Edition
Paper Dielectric Capacitors for AC and DC By-Pass Radio-Interference Reduction
交直流分路射頻干擾衰減用紙介質電容器
B-Mechanical Engineering
CNS 10224    1986 Edition
Test Code for Accuracy of Knife Grinders
鉋刀研磨機精度檢驗標準
C-Electrical Engineering
CNS 7125    1986 Edition
High - Voltage Resistance Cables for Automibiles
汽車用防止雜音電阻高壓線
G-Ferrous Materials & Metallurgy
CNS 11520    1986 Edition
Method of Pitting Potential Measurement for Stainless Steels
不銹鋼之孔蝕電位測定法
G-Ferrous Materials & Metallurgy
CNS 11521    1986 Edition
Method for Making Anode Polarization Measurement for Stainless Steels
不銹鋼之陽極極化曲線測定法
C-Electrical Engineering
CNS 8219    1986 Edition
Method of Test for Low Frequency (Below 3 MHz) Electrical Connectors (TP - 29 Contact Retention Test )
頻率3 MHz以下電連接器檢驗法(接點之牢固試驗TP-29)
C-Electrical Engineering
CNS 6127    1986 Edition
General Rules for Reliability Assured Discrete Semiconductor Devices
可靠度保證單件半導體裝置總則

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